100x defect tolerance: How we solved the yield problem
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Re: 100x defect tolerance: How we solved the yield problem
#2That said, I think they do a great job of exploiting this technique to create a "larger"[1] chip. And like storage it benefits from every core is the same and you don't need to get to every core directly (pin limiting).
In the early 2000's I was looking at a wafer scale startup that had the same idea but they were applying it to an FPGA architecture rather than a set of tensor units for LLMs. Nearly the exact same pitch, "we don't have to have all of our GLUs[2] work because the built in routing only uses the ones that are qualified." Xilinx was still aggressively suing people who put SERDES ports on FPGAs so they were pin limited overall but the idea is sound.
While I continue to believe that many people are going to collectively lose trillions of dollars ultimately pursuing "AI" at this stage. I appreciate the the amount of money people are willing to put at risk here allow for folks to try these "out of the box" kinds of ideas.
[1] It is physically more cores on a single die but the overall system is likely smaller, given the integration here.
[2] "Generic Logic Unit" which was kind of an extended LUT with some block RAM and register support.
Re: 100x defect tolerance: How we solved the yield problem
#3and run-time cpu and memory error rates are always nonzero too, though orders of magnitude lower than chip yield rates
Re: 100x defect tolerance: How we solved the yield problem
#4Not sure how that's a win.
Unless the rest of the wafer is useable for some other customer?
Re: 100x defect tolerance: How we solved the yield problem
#5That’s an interesting point. In architecture class (which was basic and abstract so I’m sure Cerebras is doing something much more clever), we learned that defects cluster, but this is a good thing. A bunch of defects clustering on one core takes out the core, a bunch of defects not clustering could take out… a bunch of cores, maybe rendering the whole chip useless.
I wonder why they don’t like clustering. I could imagine in a network of little cores, maybe enough defects clustered on the network could… sort of overwhelm it, maybe?
Also I wonder how much they benefit from being on one giant wafer. It is definitely cool as hell. But could chiplets eat away at their advantage?
Re: 100x defect tolerance: How we solved the yield problem
#6So they massively reduce the area lost to defects per wafer, from 361 to 2.2 square mm. But from the figures in this blog, this is massively outweighed by the fact that they only get 46222 sq mm useable area out of the wafer, as opposed to 56247 that the H100 gets - because they are using a single square die instead of filling the circular wafer with smaller square dies, they lose 10,025 sq mm! Not sure how that's a…
Re: 100x defect tolerance: How we solved the yield problem
#7Re: 100x defect tolerance: How we solved the yield problem
#8So they massively reduce the area lost to defects per wafer, from 361 to 2.2 square mm. But from the figures in this blog, this is massively outweighed by the fact that they only get 46222 sq mm useable area out of the wafer, as opposed to 56247 that the H100 gets - because they are using a single square die instead of filling the circular wafer with smaller square dies, they lose 10,025 sq mm! Not sure how that's a…
Re: 100x defect tolerance: How we solved the yield problem
#9So they massively reduce the area lost to defects per wafer, from 361 to 2.2 square mm. But from the figures in this blog, this is massively outweighed by the fact that they only get 46222 sq mm useable area out of the wafer, as opposed to 56247 that the H100 gets - because they are using a single square die instead of filling the circular wafer with smaller square dies, they lose 10,025 sq mm! Not sure how that's a…
Is the wafer itself so expensive? I assume they don't pattern the unused area, so the process should be quicker?
The primary driver of time and cost in the fabrication process is the number of layers for the wafers, not the surface area, since all wafers going through a given process are the same size. So you generally want to maximize the number of devices per wafer, because a large part of your costs will be calculated at the per-wafer level, not a per-device level.
Re: 100x defect tolerance: How we solved the yield problem
#10So they massively reduce the area lost to defects per wafer, from 361 to 2.2 square mm. But from the figures in this blog, this is massively outweighed by the fact that they only get 46222 sq mm useable area out of the wafer, as opposed to 56247 that the H100 gets - because they are using a single square die instead of filling the circular wafer with smaller square dies, they lose 10,025 sq mm! Not sure how that's a…
Why does their chip have to be rectangular, anyways? Couldn't they cut out a (blocky) circle too?