Earlier quoted context omitted.
Your intel example doesn't fully hold water. Chip design has taken a binning approach for decades at this point. The silicon is designed for failure in such a way that yield is maximized assuming there will be a variance in quality. Launch and iterate happens for silicon just like anything else. During the initial product launch, there is a lot of waste, but as processes are improved, microcode updated, rework proced…
It depends on what you count as a chip. Modern "chips" are actually a great many things all one one slab of silicon. Failure then knock out single components, resulting in the final chip going into one bin or another. And each of those components can be as complex as an entire "chip" from a few years ago. That is really creating reliability through numbers. Within every component any slight error will still brick tha…
Re: SpaceX Starship rocket explodes minutes after launch from Texas
#751But binning is largely binning against performance curves: "we doped this side of the wafer just a little too much and it's a little slow, but this one from the other side is just right" - while checking for faults (full chip scan and other manufacturing tests) result in dies being thrown out.